Junjie Yan
at Hefei Univ of Technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 19 November 2021 Paper
Proceedings Volume 12059, 1205921 (2021) https://doi.org/10.1117/12.2617305
KEYWORDS: Distortion, Atomic force microscope, Atomic force microscopy, Scanning probe microscopes, Raster graphics, Scanning probe microscopy, Image quality, Sensors, Scanning tunneling microscopy, Scanning electron microscopy

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