Kun Du
Student at Beihang Univ
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 23 January 2017 Paper
Kun Du, Lu Zhang, Wei Chen, Guolong Wan, Ruoran Fu
Proceedings Volume 10322, 103221O (2017) https://doi.org/10.1117/12.2265504
KEYWORDS: Extremely high frequency, Fast wavelet transforms, Edge detection, Image segmentation, Image processing, Computer security, Imaging systems, Wavelets, Wavelet transforms, Stereoscopy

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