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Dr. Laurentiu Teodorescu
at University Politehnica of Bucharest
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Publications (1)
Proceedings Article | 14 December 2016 Paper
On-wafer high temperature characterization system
L. Teodorescu, F. Drăghici, I. Rusu, G. Brezeanu
Proceedings Volume 10010, 1001006 (2016) https://doi.org/10.1117/12.2247062
KEYWORDS: Microcontrollers, Semiconducting wafers, Power supplies, Temperature metrology, Wide bandgap semiconductors, Silicon carbide, Semiconducting wafers, Power supplies, Temperature metrology, Wide bandgap semiconductors, Computer programming, Resistors, Amplifiers, Analog electronics
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