Dr. Peisen S. Huang
Prof. of Mechanical Engineering/Assoc Dean for Res at UM-SJTU Joint Institute
SPIE Involvement:
Track Chair | Editor | Author
Publications (38)

Proceedings Article | 14 September 2011 Paper
Jian Gao, Kairen Deng, Peisen Huang
Proceedings Volume 8133, 81330C (2011) https://doi.org/10.1117/12.895340
KEYWORDS: 3D metrology, Cameras, 3D modeling, Projection systems, Error analysis, Fringe analysis, Phase shifting, Data modeling, Miniature imaging systems, Structured light

Proceedings Article | 14 September 2011 Paper
Jian Gao, Xuefeng Qiang, Di Wu, Peisen Huang
Proceedings Volume 8133, 81330E (2011) https://doi.org/10.1117/12.895345
KEYWORDS: Microscopes, Projection systems, Calibration, Phase shifting, Fringe analysis, Cameras, 3D metrology, Ceramics, Channel projecting optics, Imaging systems

SPIE Journal Paper | 1 March 2010
OE, Vol. 49, Issue 03, 037201, (March 2010) https://doi.org/10.1117/12.10.1117/1.3339899
KEYWORDS: Fringe analysis, Facial recognition systems, Projection systems, 3D image processing, Detection and tracking algorithms, Phase shifts, Cameras, Skin, Fourier transforms, Databases

Proceedings Article | 10 September 2009 Paper
Xu Han, Peisen Huang, Zhicheng Deng, Leon Xu
Proceedings Volume 7432, 743211 (2009) https://doi.org/10.1117/12.829284
KEYWORDS: 3D modeling, Cameras, Projection systems, Phase shifting, Fringe analysis, 3D metrology, Imaging systems, Visibility, Calibration, Image acquisition

Proceedings Article | 10 September 2009 Paper
Xu Han, Peisen Huang, Zhicheng Deng, Leon Xu
Proceedings Volume 7432, 74320X (2009) https://doi.org/10.1117/12.828228
KEYWORDS: Cameras, Fringe analysis, Phase shifting, Projection systems, Image acquisition, 3D image processing, 3D image reconstruction, 3D modeling, 3D acquisition, Imaging systems

Showing 5 of 38 publications
Proceedings Volume Editor (8)

Showing 5 of 8 publications
Conference Committee Involvement (10)
Dimensional Optical Metrology and Inspection for Practical Applications II
25 August 2013 | San Diego, California, United States
Optical Metrology and Inspection for Industrial Applications II
5 November 2012 | Beijing, China
Dimensional Optical Metrology and Inspection for Practical Applications
22 August 2011 | San Diego, California, United States
Optical Metrology and Inspection for Industrial Applications
18 October 2010 | Beijing, China
Optical Inspection and Metrology for Non-Optics Industries
3 August 2009 | San Diego, California, United States
Showing 5 of 10 Conference Committees
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