Prof. Weishi Li
at Hefei University of Technology
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 13 June 2017 Paper
Proceedings Volume 10449, 104490V (2017) https://doi.org/10.1117/12.2270250
KEYWORDS: Projection systems, Distortion, Calibration, Fringe analysis, CCD cameras, Cameras, 3D metrology, Phase shifts, 3D image processing, Lenses

SPIE Journal Paper | 16 June 2014 Open Access
Liandong Yu, Huining Zhao, Wei Zhang, Weishi Li, Huaxia Deng, Yuntao Song, Yongqi Gu
OE, Vol. 53, Issue 12, 122406, (June 2014) https://doi.org/10.1117/12.10.1117/1.OE.53.12.122406
KEYWORDS: Precision measurement, Superconductors, Inspection, Assembly tolerances, Optical testing, Distance measurement, Optical engineering, Metrology, Lithium, Optical tracking

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