Spherically Bent Crystal Analyzers (SBCAs) are the core optical components of x-ray spectrometers. They have been widely used in many x-ray spectroscopy end-stations at synchrotron radiation and x-ray free electron laser facilities around the world. Owing to the monochromatic and focal properties of SBCAs, x-ray spectrometers with high efficiency and high energy resolution can be well applied to the study of x-ray absorption spectroscopy (XAS) and emission spectroscopy (XES). Hence, the quality of SBCAs is the key factor in determining the performance of x-ray spectrometers. Previously, we have investigated the focal properties of Si(444) SBCAs by using a laboratory’s Rowland circle device. However, the original device is limited by movement distance of motors and the space between detector and x-ray source. It is only applicable to SBCAs with a radius of curvature of 500 mm, and the maximum Bragg angle is 86°. Here, we present a new simple near backscattering detection device, which is based on a long linear guideway, to inspect the surface morphology, crystal face morphology, and focal performance of SBCAs at Bragg angle of 88°. By simply adjusting the distance between the source, SBCAs, and detector, focal performance at the focal point can be detected, while crystal face can be imaged off the focal point. By switching the x-ray source to the LED light source, surface morphology is able to be imaged as well. Furthermore, SBCAs with different radius of curvatures within 1000 mm are all measurable by this new device.
X-ray spectroscopy is an important technique for studying the material electronic structure, oxidation state and coordination, which have wide applications in energy catalysis, environmental science fields. The crystals diffract X-rays because their internal atoms are spatially ordered and the lattice spacing is on the nanometer scale, which is similar to the X-ray wavelength. In this paper, a technique based on bending and epoxy adhesive is proposed to fabricate a bent crystal analyzer. The radius of convex surface is 1‰ smaller than the concave one. The wafers and spherical substrates were cleaned with acetone and ethanol in an ultra-clean room. To remove residual organic compounds, UV ozone cleaning procedure should be used. The results show that the measured curvature radius of the bent crystal analyzer is 1000.550 mm; the surface RMS of the surface is 1.34λ and the energy resolution is better than 5 eV, which can distinguish Cu Kα1 and Kα2 fluorescence lines.
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