Prof. Yoshinao Kumagai
at Tokyo Univ of Agriculture and Technology
SPIE Involvement:
Author
Publications (6)

Proceedings Article | 1 November 2021 Paper
Verdad Agulto, Toshiyuki Iwamoto, Kazuhiro Toya, Valynn Katrine Mag-usara, Masayuki Imanishi, Ken Goto, Hisashi Murakami, Yoshinao Kumagai, Yusuke Mori, Masashi Yoshimura, Makoto Nakajima
Proceedings Volume 12057, 120574M (2021) https://doi.org/10.1117/12.2606988
KEYWORDS: Terahertz radiation, Gallium nitride, Semiconducting wafers, Refractive index, Semiconductors, Terahertz spectroscopy, Ellipsometry

Proceedings Article | 5 March 2021 Presentation
Nao Takekawa, Ken Goto, Toru Nagashima, Reo Yamamoto, Junji Kotani, Yoshinao Kumagai
Proceedings Volume 11686, 116861F (2021) https://doi.org/10.1117/12.2577988
KEYWORDS: Aluminum nitride, Silicon, Quartz, Crystals, Temperature metrology, Semiconductors, Manufacturing, Glasses, Aluminum

Proceedings Article | 5 March 2021 Presentation
Yoshinao Kumagai, Nao Takekawa, Ken Goto, Toru Nagashima, Reo Yamamoto, Junji Kotani
Proceedings Volume 11706, 117060M (2021) https://doi.org/10.1117/12.2577987
KEYWORDS: Aluminum nitride, Deep ultraviolet, Transparency, Viruses, Vapor phase epitaxy, Solid state electronics, Reliability, Optical components, Metals

Proceedings Article | 10 March 2020 Presentation
Ken Goto, Nao Takekawa, Hisashi Murakami, Akito Kuramata, Shigenobu Yamakoshi, Bo Monemar, Masataka Higashiwaki, Yoshinao Kumagai
Proceedings Volume 11281, 112810E (2020) https://doi.org/10.1117/12.2551598

Proceedings Article | 5 March 2020 Paper
Proceedings Volume 11281, 112810L (2020) https://doi.org/10.1117/12.2544818
KEYWORDS: Reliability

Showing 5 of 6 publications
SIGN IN TO:
  • View contact details

UPDATE YOUR PROFILE
Is this your profile? Update it now.
Don’t have a profile and want one?

Advertisement
Advertisement
Back to Top