Yuhao Shang
at Nanjing Univ of Science and Technology
SPIE Involvement:
Author
Publications (1)

Proceedings Article | 7 October 2020 Paper
Proceedings Volume 11571, 1157117 (2020) https://doi.org/10.1117/12.2580542
KEYWORDS: 3D metrology, Fringe analysis, Speckle pattern, Phase shifts, Projection systems, 3D modeling, Speckle, Optical filters

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