Mr. Curtis M. Webb Profile

Curtis M. Webb

Consultant

SPIE Involvement:

Conference Program Committee | Author

Proceedings Article | 5 June 2013 Paper

Active SWIR laboratory testing methodology

Curtis Webb, Steve White, Brian Rich

Proceedings Volume 8706, 87060A (2013) https://doi.org/10.1117/12.2018909

KEYWORDS: Short wave infrared radiation, Sensors, Forward looking infrared, Imaging systems, Performance modeling, Atmospheric modeling, Cameras, Infrared imaging, Semiconductor lasers, Systems modeling

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Proceedings Article | 22 August 2003 Paper

History of FLIR testing

Curtis Webb

Proceedings Volume 5076, (2003) https://doi.org/10.1117/12.498127

KEYWORDS: Forward looking infrared, Systems modeling, Sensors, Performance modeling, Thermography, Modulation transfer functions, Imaging systems, Image intensifiers, Infrared imaging, Thermal modeling

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Proceedings Article | 17 July 2000 Paper

Scene-based algorithm for improved FLIR performance

James Gruben, Paul Neiswander, Hao Tran, Curtis Webb

Proceedings Volume 4030, (2000) https://doi.org/10.1117/12.391779

KEYWORDS: Detection and tracking algorithms, Forward looking infrared, Buildings, Visualization, Target detection, Algorithm development, Image processing, Field emission displays, Automatic control, Image display

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SPIE Journal Paper | 1 May 1999

Laboratory measurement of sampled infrared imaging system performance

Ronald Driggers, Curtis Webb, Stanley Pruchnic, Carl Halford, Eddie Burroughs

OE, Vol. 38, Issue 05, (May 1999) https://doi.org/10.1117/12.10.1117/1.602249

KEYWORDS: Modulation transfer functions, Imaging systems, Sensors, Infrared imaging, Performance modeling, Infrared radiation, Minimum resolvable temperature difference, Temperature metrology, Systems modeling, Infrared sensors

SPIE Journal Paper | 1 May 1999

Dynamic minimum resolvable temperature testing for staring array imagers

Curtis Webb, Carl Halford

OE, Vol. 38, Issue 05, (May 1999) https://doi.org/10.1117/12.10.1117/1.602281

KEYWORDS: Sensors, Staring arrays, Imaging systems, Spatial frequencies, Modulation transfer functions, Visual system, Phase shift keying, Modulation, Eye, Visual process modeling

SPIE Journal Paper | 1 June 1998

Staring imager minimum resolvable temperature measurements beyond the sensor half sample rate

Richard Vollmerhausen, Ronald Driggers, Curtis Webb, Timothy Edwards

OE, Vol. 37, Issue 06, (June 1998) https://doi.org/10.1117/12.10.1117/1.601829

KEYWORDS: Sensors, Imaging systems, Modulation, Phase shift keying, Modulation transfer functions, Signal detection, Analog electronics, Temperature metrology, Target detection, Electronics

Proceedings Article | 22 May 1995 Paper

Approach to three-dimensional noise spectral analysis

Curtis Webb

Proceedings Volume 2470, (1995) https://doi.org/10.1117/12.210056

KEYWORDS: Sensors, 3D modeling, Minimum resolvable temperature difference, 3D image processing, Systems modeling, Thermal modeling, Visual process modeling, Performance modeling, 3D displays, Signal to noise ratio

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Proceedings Article | 8 July 1994 Paper

Minimum resolvable temperature difference -- how far can we stretch it?

Curtis Webb

Proceedings Volume 2224, (1994) https://doi.org/10.1117/12.180068

KEYWORDS: Sensors, Minimum resolvable temperature difference, Thermography, Imaging systems, Flat panel displays, Image enhancement, Image sensors, Image processing, Temperature metrology, Interference (communication)

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Proceedings Article | 16 September 1992 Paper

Observer variables in minimum-resolvable temperature difference

Curtis Webb, Gerald Holst

Proceedings Volume 1689, (1992) https://doi.org/10.1117/12.137965

KEYWORDS: Minimum resolvable temperature difference, Sensors, Eye, Spatial frequencies, Head, Systems modeling, Target detection, Eye models, Imaging systems, Infrared sensors

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Proceedings Article | 29 January 1992 Paper

Laboratory analysis of discretely sampled thermal imaging systems

Curtis Webb

Proceedings Volume 2075, 20750O (1992) https://doi.org/10.1117/12.2300252

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Proceedings Article | 1 September 1991 Paper

Three-dimensional analysis framework and measurement methodology for imaging system noise

John D'Agostino, Curtis Webb

Proceedings Volume 1488, (1991) https://doi.org/10.1117/12.45794

KEYWORDS: 3D image processing, 3D modeling, Systems modeling, Composites, Imaging systems, Data modeling, Thermal modeling, Sensors, Analytical research, Minimum resolvable temperature difference

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Proceedings Article | 1 September 1991 Paper

What is MRT and how do I get one?

Carl Hoover, Curtis Webb

Proceedings Volume 1488, (1991) https://doi.org/10.1117/12.45809

KEYWORDS: Minimum resolvable temperature difference, Sensors, Systems modeling, Collimators, Forward looking infrared, Imaging systems, Modulation transfer functions, Infrared sensors, Thermography, Thermal modeling

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Proceedings Article | 1 September 1991 Paper

AutoSPEC image evaluation laboratory

James Brown, Curtis Webb, Paul Bell, Randolph Washington, Richard Riordan

Proceedings Volume 1488, (1991) https://doi.org/10.1117/12.45811

KEYWORDS: Sensors, Thermography, Mirrors, Systems modeling, Image processing, Image analysis, Thermal modeling, Imaging systems, Infrared imaging, Collimators

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Proceedings Article | 1 October 1990 Paper

Results of laboratory evaluation of staring arrays

Curtis Webb

Proceedings Volume 1309, (1990) https://doi.org/10.1117/12.21783

KEYWORDS: Minimum resolvable temperature difference, Staring arrays, Systems modeling, Contrast transfer function, Sensors, Imaging systems, Thermography, Infrared imaging, Modulation transfer functions, Analytical research

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Showing 5 of 14 publications

Conference Committee Involvement (22)

Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXXV

23 April 2024 | National Harbor, Maryland, United States

Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXXIV

3 May 2023 | Orlando, Florida, United States

Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXXIII

6 April 2022 | Orlando, Florida, United States

Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXXII

12 April 2021 | Online Only, Florida, United States

Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXXI

27 April 2020 | Online Only, California, United States

Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXX

16 April 2019 | Baltimore, MD, United States

Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXIX

17 April 2018 | Orlando, FL, United States

Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXVIII

11 April 2017 | Anaheim, CA, United States

Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXVII

19 April 2016 | Baltimore, MD, United States

Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXVI

21 April 2015 | Baltimore, MD, United States

Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXV

6 May 2014 | Baltimore, MD, United States

Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXIV

30 April 2013 | Baltimore, Maryland, United States

Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXIII

24 April 2012 | Baltimore, Maryland, United States

Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXII

26 April 2011 | Orlando, Florida, United States

Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XXI

6 April 2010 | Orlando, Florida, United States

Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XX

14 April 2009 | Orlando, Florida, United States

Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XIX

18 March 2008 | Orlando, Florida, United States

Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XVIII

11 April 2007 | Orlando, Florida, United States

Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XVII

19 April 2006 | Orlando (Kissimmee), Florida, United States

Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XVI

30 March 2005 | Orlando, Florida, United States

Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XV

14 April 2004 | Orlando, Florida, United States

Infrared Imaging Systems: Design, Analysis, Modeling, and Testing XIV

23 April 2003 | Orlando, Florida, United States

Showing 5 of 22 Conference Committees

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