Zhang Yuqi
at SAIC
SPIE Involvement:
Author
Publications (2)

Proceedings Article | 24 November 2023 Paper
Proceedings Volume 12935, 129350D (2023) https://doi.org/10.1117/12.3000590
KEYWORDS: Vertical cavity surface emitting lasers, Failure analysis, Oxides, Reliability, Quantum wells, Transmission electron microscopy, Activation energy, Accelerated life testing, Temperature metrology, Indium gallium arsenide

Proceedings Article | 16 February 2022 Paper
Proceedings Volume 12164, 121641H (2022) https://doi.org/10.1117/12.2628609
KEYWORDS: Oxides, Vertical cavity surface emitting lasers, Failure analysis, Oxidation, Reliability, Transmission electron microscopy, Humidity, Manufacturing, Semiconductor lasers

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