Reflectivity And Resolution Measurements Of Metallic Multilayers, Beryl, And Potassium Acid Phthalate (KAP) With Synchrotron Radiation In The 1 keV Region

M. Berland; A. Burek; P. Dhez; J. M. Esteva; B. Gauthe; R. C. Karnatak; R. E. LaVilla

doi:10.1117/12.933151

24 March 1982 Reflectivity And Resolution Measurements Of Metallic Multilayers, Beryl, And Potassium Acid Phthalate (KAP) With Synchrotron Radiation In The 1 keV Region

M. Berland, A. Burek, P. Dhez, J. M. Esteva, B. Gauthe, R. C. Karnatak, R. E. LaVilla

Author Affiliations +

Proceedings Volume 0316, High Resolution Soft X-Ray Optics; (1982) https://doi.org/10.1117/12.933151
Event: 1981 Brookhaven Conferences, 1981, Upton, United States

Abstract

A recently constructed reflectometer at LURE used with monochromatized intense synchrotron radiation offers new possibilities for absolute measurements of reflectivity and resolution for metallic multilayers, and natural and synthetic crystals in a wide range of wavelengths. Contrary to the procedure generally used for the reflectivity measurements, in the present arrangement the crystal or multilayer is set at a fixed angle θ_o corresponding to a desired energy E_o and the energy of the highly polarized incident photon beam is varied around this value by means of a double crystal monochromator. The reflectivity versus energy for a given polarization are obtained directly for the sample crystal. In this communication we give the first examples for the absolute reflectivity and resolution measurements around 1 keV of metallic multilayers, beryl and KAP thus illustrating the potential application of this method.

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M. Berland, A. Burek, P. Dhez, J. M. Esteva, B. Gauthe, R. C. Karnatak, and R. E. LaVilla "Reflectivity And Resolution Measurements Of Metallic Multilayers, Beryl, And Potassium Acid Phthalate (KAP) With Synchrotron Radiation In The 1 keV Region", Proc. SPIE 0316, High Resolution Soft X-Ray Optics, (24 March 1982); https://doi.org/10.1117/12.933151

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