3.8 Micron Interferometry For Testing Coated Optics

James C. Wyant

doi:10.1117/12.933297

29 April 1982 3.8 Micron Interferometry For Testing Coated Optics

James C. Wyant

Proceedings Volume 0325, Optical Thin Films; (1982) https://doi.org/10.1117/12.933297
Event: 1982 Los Angeles Technical Symposium, 1982, Los Angeles, United States

Abstract

Large wavefront phase errors introduced by small thickness changes in multilayer high reflectance coatings are discussed. The importance of measuring these wavefront phase errors at the wavelength the coating is to be used is illustrated. Plans for an interferometer working at a wavelength of 3.8 microns for measuring wavefront phase errors introduced by coating nonuniformity are described.

Citation Download Citation

James C. Wyant "3.8 Micron Interferometry For Testing Coated Optics", Proc. SPIE 0325, Optical Thin Films, (29 April 1982); https://doi.org/10.1117/12.933297

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