Line Source X-Ray Microscopy

R. J. Rosser

doi:10.1117/12.939196

27 March 1984 Line Source X-Ray Microscopy

R. J. Rosser

Proceedings Volume 0447, Science with Soft X-Rays; (1984) https://doi.org/10.1117/12.939196
Event: 1983 Brookhaven Conference: Science with Soft X-Rays, 1983, Upton, United States

Abstract

The theoretical aspects of using line radiation sources for soft x-ray microscopy are discussed. High resolution, absolutely calibrated spectra of a gas-puff z-pinch source are presented. A qualitative discussion of radiation damage mechanisms and the time scales involved indicate that any picture taken in less than a millisecond may be less damaged by the radiation. Results of a first attempt to use a 100J, nanosecond laser to produce a carbon plasma as a source for very short time-scale microscopy are presented.

Citation Download Citation

R. J. Rosser "Line Source X-Ray Microscopy", Proc. SPIE 0447, Science with Soft X-Rays, (27 March 1984); https://doi.org/10.1117/12.939196

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