Emission Characteristics Of Microwave Plasma In The Near Infrared

Joseph Hubert; HuuVan Tra; Frederick L. Baudais

doi:10.1117/12.970881

20 December 1985 Emission Characteristics Of Microwave Plasma In The Near Infrared

Joseph Hubert, HuuVan Tra, Frederick L. Baudais

Proceedings Volume 0553, Fourier and Computerized Infrared Spectroscopy; (1985) https://doi.org/10.1117/12.970881
Event: 1985 International Conference on Fourier and Computerized Infrared Spectroscopy, 1985, Ottawa, Canada

Abstract

Fourier transform spectroscopy has not been widely used to detect atomic emission from atmospheric plasmas. Fourier transform spectrophotometers are capable of the simultaneous and continuous measurement of atomic emission, and thus allow flexibility in the choice of emission lines for quantitative analysis and in the ability to correct for background changes. The combination gi.f the Surfatron cavity for the generation of atomic emission in a microwave induced plasma and a FT spectrophotometer for the detection and quantitation of atomic species eluted from a gas chromatograph is reported for a number of the nonmetallic elements.

Citation Download Citation

Joseph Hubert, HuuVan Tra, and Frederick L. Baudais "Emission Characteristics Of Microwave Plasma In The Near Infrared", Proc. SPIE 0553, Fourier and Computerized Infrared Spectroscopy, (20 December 1985); https://doi.org/10.1117/12.970881

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