Spectral Directional Emittance Measurements In The Wavelength Range From 1 µm To 15 µm

K. Gindele; M. Kohl; M. Mast

doi:10.1117/12.970873

20 December 1985 Spectral Directional Emittance Measurements In The Wavelength Range From 1 µm To 15 µm

K. Gindele, M. Kohl, M. Mast

Proceedings Volume 0553, Fourier and Computerized Infrared Spectroscopy; (1985) https://doi.org/10.1117/12.970873
Event: 1985 International Conference on Fourier and Computerized Infrared Spectroscopy, 1985, Ottawa, Canada

Abstract

It is the spectral emittance which governs the thermooptical behaviour of surfaces and coatings. It is also the spectral emittance which causes the most serious measuring problems in characterizing coatings. In principle there are two methods: the measurement of the emitted thermal radiation of heated samples and the measurement of the reflectance of opaque samples ( E( X) = 1 - 9(X)). The determination of the reflectance requires the measurement of the radiation reflected into the whole hemisphere, since most of the investigated surfaces are reflecting diffusely. In the spectral range from 1 pm to about 15 μm this can be done with the aid of integrating spheres.

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K. Gindele, M. Kohl, and M. Mast "Spectral Directional Emittance Measurements In The Wavelength Range From 1 µm To 15 µm", Proc. SPIE 0553, Fourier and Computerized Infrared Spectroscopy, (20 December 1985); https://doi.org/10.1117/12.970873

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