A Practical Architecture For Machine Vision Based Measurement And Inspection

E. Panofsky; D. McGhie

doi:10.1117/12.966255

19 December 1985 A Practical Architecture For Machine Vision Based Measurement And Inspection

E. Panofsky, D. McGhie

Proceedings Volume 0557, Automatic Inspection and Measurement; (1985) https://doi.org/10.1117/12.966255
Event: 29th Annual Technical Symposium, 1985, San Diego, United States

Abstract

Drawing on experience gained in the design and construction of vision based workstations for measurement and inspection, utilized in industrial process and quality control, the requirements for a vision analysis system are explored. A description of an architecture for a vision system implementing these requirements is presented.

Citation Download Citation

E. Panofsky and D. McGhie "A Practical Architecture For Machine Vision Based Measurement And Inspection", Proc. SPIE 0557, Automatic Inspection and Measurement, (19 December 1985); https://doi.org/10.1117/12.966255

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