Using Photo Voltaic Diodes To Measure The Deformation Response Of A Structure Subjected To An Explosive Load

G. N. Nurick

doi:10.1117/12.975555

1 September 1987 Using Photo Voltaic Diodes To Measure The Deformation Response Of A Structure Subjected To An Explosive Load

G. N. Nurick

Author Affiliations +

Proceedings Volume 0674, 17th Intl Congress on High Speed Photography and Photonics; (1987) https://doi.org/10.1117/12.975555
Event: 17th International Conference on High Speed Photography and Photonics, 1986, Pretoria, South Africa

Abstract

This paper describes a technique which measures the deflection-time history of a structure subjected to an explosive load. Photo voltaic diodes are used to measure the light interference patterns obtained during deformation. Deflections of up to 20 mm over a time period of 200 μs have been observed.

Citation Download Citation

G. N. Nurick "Using Photo Voltaic Diodes To Measure The Deformation Response Of A Structure Subjected To An Explosive Load", Proc. SPIE 0674, 17th Intl Congress on High Speed Photography and Photonics, (1 September 1987); https://doi.org/10.1117/12.975555

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