Abstract
Neutron reflection is perhaps the most developed branch of slow neutrons optics, which in itself is a direct consequence of the undulatory nature of the neutron. After reviewing the basic types of interactions (nuclear and magnetic) between neutrons and matter, the formalism is introduced to calculate the reflectivity from a sample composed of stacked flat layers and, inversely, to calculate the stacking from reflectivity measurements. Finally, a brief survey of the applications of neutron reflection is given, both in technology and in fundamental research.
© (1989) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
G. P. Felcher "Principles Of Neutron Reflection", Proc. SPIE 0983, Thin Film Neutron Optical Devices: Mirrors, Supermirrors, Multilayer Monochromators, Polarizers, and Beam Guides, (18 January 1989); https://doi.org/10.1117/12.948740
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Cited by 12 scholarly publications.
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KEYWORDS
Reflectivity

Magnetism

Reflection

Optical components

Scattering

Thin films

Quantization

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