Presentation + Paper
27 March 2017 Dual brush process for selective surface modification in graphoepitaxy directed self-assembly
Jan Doise, Boon Teik Chan, Masafumi Hori, Roel Gronheid
Author Affiliations +
Abstract
Grapho-epitaxy directed self-assembly is a potential low-cost solution for patterning via layers with pitches beyond the reach of a single optical lithographic exposure. In this process, selective control of the interfacial energy at the bottom and sidewall of the template is an important but challenging exercise. In this work, a dual brush process is implemented, in which two brushes with distinct end-groups are consecutively grafted to the pre-pattern to achieve fully independent modification of the bottom and sidewall surface of the template. A comprehensive study of hole pattern quality shows that using a dual brush process leads to a substantial improvement in terms of positional and dimensional variability across the process window. These findings will be useful to others who wish to manipulate polymer-surface interactions in directed self-assembly flows.
Conference Presentation
© (2017) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Jan Doise, Boon Teik Chan, Masafumi Hori, and Roel Gronheid "Dual brush process for selective surface modification in graphoepitaxy directed self-assembly", Proc. SPIE 10146, Advances in Patterning Materials and Processes XXXIV, 101460R (27 March 2017); https://doi.org/10.1117/12.2259791
Lens.org Logo
CITATIONS
Cited by 3 scholarly publications and 1 patent.
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Picosecond phenomena

System on a chip

Polymethylmethacrylate

Directed self assembly

Optical lithography

Polymers

Scanning electron microscopy

Back to Top