Statistical characterization of an x-ray FEL in the spectral domain

Alberto Lutman; Zhirong Huang; Jacek Krzywinski; Juhao Wu; Diling Zhu; Yiping Feng

doi:10.1117/12.2268918

23 May 2017 Statistical characterization of an x-ray FEL in the spectral domain

Alberto Lutman, Zhirong Huang, Jacek Krzywinski, Juhao Wu, Diling Zhu, Yiping Feng

Proceedings Volume 10237, Advances in X-ray Free-Electron Lasers Instrumentation IV; 102370H (2017) https://doi.org/10.1117/12.2268918
Event: SPIE Optics + Optoelectronics, 2017, Prague, Czech Republic

Abstract

We have experimentally measured and characterized a Self-Amplified Spontaneous Emission (SASE) Free Electron Laser (FEL) in the spectral domain. Spectra were captured for hard X-rays using a pair of transmissive bent-crystal spectrometers on a single-shot basis. The probability distributions of the spectral intensity as a function of an increasing bandwidth were studied in different SASE regimes. The number of spectral modes was found to grow linearly in the exponential growth regime, but the growth became super-linear at saturation and in deeper saturation, consistent with the current theoretical understanding and simulations. The spectral intensity fluctuations were found to decrease when a wider portion of the beam (transverse to the direction of the dispersion) was integrated, indicating a partial spatial coherence, the degree of which was then estimated.

Conference Presentation

Citation Download Citation

Alberto Lutman, Zhirong Huang, Jacek Krzywinski, Juhao Wu, Diling Zhu, and Yiping Feng "Statistical characterization of an x-ray FEL in the spectral domain", Proc. SPIE 10237, Advances in X-ray Free-Electron Lasers Instrumentation IV, 102370H (23 May 2017); https://doi.org/10.1117/12.2268918

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