On bit-depth of pattern in three-dimensional measurement system based on digital fringe projection

Yong Li; Jinbiao Chen; Yanshuai Tu; Hui Wang

doi:10.1117/12.2266740

10 February 2017 On bit-depth of pattern in three-dimensional measurement system based on digital fringe projection

Yong Li, Jinbiao Chen, Yanshuai Tu, Hui Wang

Proceedings Volume 10250, International Conference on Optical and Photonics Engineering (icOPEN 2016); 1025018 (2017) https://doi.org/10.1117/12.2266740
Event: Fourth International Conference on Optical and Photonics Engineering, 2016, Chengdu, China

Abstract

Fringe pattern can be projected fast by digital projector using DLP technology. The projection speed is higher when patterns with lower bit-depth are adopted. The phase error of sinusoidal fringe pattern with different bit-depth is studied with three-step phase-shifting algorithm. The uniform quantization algorithm (UQA) and quantization algorithm with error diffusion (EDA) are used for pattern quantization. The conclusions are as following. 1) With UQA, the maximum of phase error will less than 1% of 2π when bit-depth is higher than 4 bits. If the projector is defocused, the error will be decreased. 2) With EDA, the maximum of phase error is larger than that with UQA. But the error will be decreased significantly when the projector is defocused. The phase error of pattern with EDA is smaller than that of pattern with UQA when the projector is nearly focused and the period of pattern is long (for example longer than 20 pixels). If the period of pattern is short, the performance of UQA is always better. 3) The error difference of UQA and EDA will be very small when the bit-depth is higher than 4 bits.

Citation Download Citation

Yong Li, Jinbiao Chen, Yanshuai Tu, and Hui Wang "On bit-depth of pattern in three-dimensional measurement system based on digital fringe projection", Proc. SPIE 10250, International Conference on Optical and Photonics Engineering (icOPEN 2016), 1025018 (10 February 2017); https://doi.org/10.1117/12.2266740

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available