Refractive index anisotropy in optics using a birefringence mapper

Jennifer Sternal

doi:10.1117/12.2284032

19 May 2003 Refractive index anisotropy in optics using a birefringence mapper

Jennifer Sternal

Proceedings Volume 10314, Optifab 2003: Technical Digest; 1031417 (2003) https://doi.org/10.1117/12.2284032
Event: OptiFab 2003, 2003, Rochester, NY, United States

Abstract

Areal maps of optical retardance are rapidly generated for flat, transmissive optics using a new commercial birefringence mapper. The versatility and capabilities of the mapper are evaluated for a series of parts that include laser glass samples, laser damaged glass, liquid crystal devices, birefringent crystals, and polymers. Potential users may be trained to use the instrument in less than one hour.

Citation Download Citation

Jennifer Sternal "Refractive index anisotropy in optics using a birefringence mapper", Proc. SPIE 10314, Optifab 2003: Technical Digest, 1031417 (19 May 2003); https://doi.org/10.1117/12.2284032

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