New Convenient Method For The Determination Of Electro-Optic Constants Of Thin Films

Hisao Uchiki; Takayoshi Kobayashi

doi:10.1117/12.950635

18 May 1989 New Convenient Method For The Determination Of Electro-Optic Constants Of Thin Films

Hisao Uchiki, Takayoshi Kobayashi

Proceedings Volume 1033, Trends in Quantum Electronics; (1989) https://doi.org/10.1117/12.950635
Event: International Conference on Trends in Quantum Electronics, 1988, Bucharest, Romania

Abstract

A new method for the determination of the electro-optic constant is proposed and de-monstrated for polycarbonate films doped with 4-diethylamino-4'-nitrostilbene. Third-order nonlinear susceptibility x(³)(-w; w, 0,0) of the film was determined between 00 and 800 nm at room temperature by using this method. X(3)(-wi5,0, 0) is (64-4i)x10^-12 esu or quadratic electro-optic constant is (-1-0.7i)x10-20 m2/1T2 at 597 nrn,

Citation Download Citation

Hisao Uchiki and Takayoshi Kobayashi "New Convenient Method For The Determination Of Electro-Optic Constants Of Thin Films", Proc. SPIE 1033, Trends in Quantum Electronics, (18 May 1989); https://doi.org/10.1117/12.950635

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