Paper
29 August 2017 Progress on the fabrication of lightweight single-crystal silicon x-ray mirrors
Author Affiliations +
Abstract
Single crystal silicon is an excellent X-ray mirror substrate material due to its high stiffness, low density, high thermal conductivity, zero internal stress, and commercial availability. At NASA Goddard Space Flight Center, we have been developing a process for producing high resolution and lightweight X-ray mirror segments at low cost and with high throughput. Previously we demonstrated the possibility of producing X-ray mirrors which meet the high demands of a future X-ray mission. Presently, we are producing lightweight X-ray mirror segments of unprecedented quality. This paper presents results from these recent investigations.
© (2017) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Raul E. Riveros, Michael P. Biskach, Kim D. Allgood, John D. Kearney, Michal Hlinka, and William W. Zhang "Progress on the fabrication of lightweight single-crystal silicon x-ray mirrors", Proc. SPIE 10399, Optics for EUV, X-Ray, and Gamma-Ray Astronomy VIII, 103990T (29 August 2017); https://doi.org/10.1117/12.2273918
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Cited by 7 scholarly publications.
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KEYWORDS
Mirrors

X-rays

Silicon

Crystals

Surface finishing

Polishing

Manufacturing

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