Progress towards picometer accuracy laser metrology for the space interferometry mission

Peter G. Halverson; Andreas Kuhnert; Jennifer Logan; Martin Regehr; Stuart Shaklan; Robert Spero; Feng Zhao; Tallis Chang; Edouard Schmidtlin; Roman Gutierrez; Thomas VanZandt; Jeffrey Yu

doi:10.1117/12.2307867

21 November 2017 Progress towards picometer accuracy laser metrology for the space interferometry mission

Peter G. Halverson, Andreas Kuhnert, Jennifer Logan, Martin Regehr, Stuart Shaklan, Robert Spero, Feng Zhao, Tallis Chang, Edouard Schmidtlin, Roman Gutierrez, Thomas VanZandt, Jeffrey Yu

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Proceedings Volume 10569, International Conference on Space Optics — ICSO 2000; 1056919 (2017) https://doi.org/10.1117/12.2307867
Event: International Conference on Space Optics 2000, 2000, Toulouse Labège, France

Abstract

The Space Interferometry Mission, scheduled for launch in 2008, is an optical stellar interferometer with a 10 meter baseline capable of micro-arcsecond accuracy astrometry. A mission-enabling technology development program is underway at JPL, including the design and test of heterodyne interferometer metrology gauges to monitor the separation of optical components of the stellar interferometer. The gauges are required to have a resolution of 15 picometers and to track the motion of mirrors over several meters. We report laboratory progress in meeting these goals.

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Peter G. Halverson, Andreas Kuhnert, Jennifer Logan, Martin Regehr, Stuart Shaklan, Robert Spero, Feng Zhao, Tallis Chang, Edouard Schmidtlin, Roman Gutierrez, Thomas VanZandt, and Jeffrey Yu "Progress towards picometer accuracy laser metrology for the space interferometry mission", Proc. SPIE 10569, International Conference on Space Optics — ICSO 2000, 1056919 (21 November 2017); https://doi.org/10.1117/12.2307867

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