Femtosecond Z-scan measurements of the nonlinear refractive index of fused silica

Lin Zhang; Zhendong Shi; Hua Ma; Huan Ren; Quan Yuan; Yurong Ma; Xiaoxuan Feng; Bo Chen; Yi Yang

doi:10.1117/12.2295559

12 January 2018 Femtosecond Z-scan measurements of the nonlinear refractive index of fused silica

Lin Zhang, Zhendong Shi, Hua Ma, Huan Ren, Quan Yuan, Yurong Ma, Xiaoxuan Feng, Bo Chen, Yi Yang

Proceedings Volume 10621, 2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems; 106210H (2018) https://doi.org/10.1117/12.2295559
Event: International Conference on Optical Instruments and Technology 2017, 2017, Beijing, China

Abstract

Z-scan technology is a popular experimental technique for determining the nonlinear refractive index of the material. However, it encounters a great difficulty in measuring the weak nonlinear material like fused silica which is about two orders of magnitude below the nonlinear refractive index of most of the materials studied with the nanosecond and picosecond Z-scan methods. In this case, the change of refractive index introduced by accumulation of thermal effects cannot be neglected. In order to have a reliable measurement of the nonlinear refractive index, a metrology bench based on the femtosecond Z-scan technology is developed. The intensity modulation component and the differential measurement system are applied to guarantee the accuracy of the measuring system. Based on the femtosecond Z-scan theory, the femtosecond laser Z-scan technique is performed on fused silica, and the nonlinear refractive index of Fused silica is determined to be 9.2039×10^-14esu for 800nm, 37fs pulse duration at I0=50GW/cm² with a good repeatability of 6.7%.

Citation Download Citation

Lin Zhang, Zhendong Shi, Hua Ma, Huan Ren, Quan Yuan, Yurong Ma, Xiaoxuan Feng, Bo Chen, and Yi Yang "Femtosecond Z-scan measurements of the nonlinear refractive index of fused silica", Proc. SPIE 10621, 2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 106210H (12 January 2018); https://doi.org/10.1117/12.2295559

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