Analysis on the dynamic error for optoelectronic scanning coordinate measurement network

Shendong Shi; Linghui Yang; Jiarui Lin; Siyang Guo; Yongjie Ren

doi:10.1117/12.2296263

12 January 2018 Analysis on the dynamic error for optoelectronic scanning coordinate measurement network

Shendong Shi, Linghui Yang, Jiarui Lin, Siyang Guo, Yongjie Ren

Proceedings Volume 10621, 2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems; 106210N (2018) https://doi.org/10.1117/12.2296263
Event: International Conference on Optical Instruments and Technology 2017, 2017, Beijing, China

Abstract

Large-scale dynamic three-dimension coordinate measurement technique is eagerly demanded in equipment manufacturing. Noted for advantages of high accuracy, scale expandability and multitask parallel measurement, optoelectronic scanning measurement network has got close attention. It is widely used in large components jointing, spacecraft rendezvous and docking simulation, digital shipbuilding and automated guided vehicle navigation. At present, most research about optoelectronic scanning measurement network is focused on static measurement capacity and research about dynamic accuracy is insufficient. Limited by the measurement principle, the dynamic error is non-negligible and restricts the application. The workshop measurement and positioning system is a representative which can realize dynamic measurement function in theory. In this paper we conduct deep research on dynamic error resources and divide them two parts: phase error and synchronization error. Dynamic error model is constructed. Based on the theory above, simulation about dynamic error is carried out. Dynamic error is quantized and the rule of volatility and periodicity has been found. Dynamic error characteristics are shown in detail. The research result lays foundation for further accuracy improvement.

Citation Download Citation

Shendong Shi, Linghui Yang, Jiarui Lin, Siyang Guo, and Yongjie Ren "Analysis on the dynamic error for optoelectronic scanning coordinate measurement network", Proc. SPIE 10621, 2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 106210N (12 January 2018); https://doi.org/10.1117/12.2296263

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available

Members: $17.00

Non-members: $21.00 ADD TO CART

PROCEEDINGS
9 PAGES

DOWNLOAD PAPER SAVE TO MY LIBRARY

GET CITATION

RIGHTS & PERMISSIONS

Get copyright permission Get copyright permission on Copyright Marketplace

KEYWORDS

Receivers

Transmitters

Error analysis

Optoelectronics

Head

Manufacturing

Analytical research

Show All Keywords

Keywords/Phrases

Search In:

Publication Years