Multi-axis parallelism measuring system with temperature insensitivity

Lei Zhang; Kai Zhang

doi:10.1117/12.2288058

12 January 2018 Multi-axis parallelism measuring system with temperature insensitivity

Lei Zhang, Kai Zhang

Proceedings Volume 10621, 2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems; 106210W (2018) https://doi.org/10.1117/12.2288058
Event: International Conference on Optical Instruments and Technology 2017, 2017, Beijing, China

Abstract

In order to detect the parallelism of optical axis of photoelectric device accurately in large temperature difference environment, we design a measuring system based on Cassegrain structure. The system is adapt to the temperature range from −40° to +55° with the spectral bandwidth from 0.4μm to 12μm. According to the demand of temperature stability, the athermal structure of the system is analyzed and the compensation by different mechanical materials is carried out. The beam parallel deviation is less than 4" in different temperature. The experimental result shows that the system has good temperature stability.

Citation Download Citation

Lei Zhang and Kai Zhang "Multi-axis parallelism measuring system with temperature insensitivity", Proc. SPIE 10621, 2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 106210W (12 January 2018); https://doi.org/10.1117/12.2288058

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