Dielectric and metal target identification based on polarized light scattering analysis: a numerical study

Zhen-Gang Yan; Weiping Sun; Meng Ren; Hongpeng Lv; Jie Li; Liang Xue; Keding Yan; Shouyu Wang

doi:10.1117/12.2292521

12 January 2018 Dielectric and metal target identification based on polarized light scattering analysis: a numerical study

Zhen-Gang Yan, Weiping Sun, Meng Ren, Hongpeng Lv, Jie Li, Liang Xue, Keding Yan, Shouyu Wang

Author Affiliations +

Proceedings Volume 10621, 2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems; 1062117 (2018) https://doi.org/10.1117/12.2292521
Event: International Conference on Optical Instruments and Technology 2017, 2017, Beijing, China

Abstract

In order to quantitatively analyze scattering from two dimensional randomly rough Gaussian surfaces, Kirchhoff approximation method is adopted in numerical calculation for analyzing full angular Stokes vectors of light scattering. With studying both the p- and s-polarized scattering fields from various materials such as metals and dielectrics, it is found that V components of scattering light from metals and dielectrics are different. Via analytical calculation according to slope probability density, the V component difference is attributed to refractive index of materials. Both numerical and analytical calculations prove the V component difference in light scattering can act as a criterion for metal and dielectric identification.

Citation Download Citation

Zhen-Gang Yan, Weiping Sun, Meng Ren, Hongpeng Lv, Jie Li, Liang Xue, Keding Yan, and Shouyu Wang "Dielectric and metal target identification based on polarized light scattering analysis: a numerical study", Proc. SPIE 10621, 2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 1062117 (12 January 2018); https://doi.org/10.1117/12.2292521

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