High resolution particle tracking method by suppressing the wavefront aberrations

Xinyu Chang; Yuan Yang; Li Kou; Lei Jin; Junsheng Lu; Xiaodong Hu

doi:10.1117/12.2292973

12 January 2018 High resolution particle tracking method by suppressing the wavefront aberrations

Xinyu Chang, Yuan Yang, Li Kou, Lei Jin, Junsheng Lu, Xiaodong Hu

Proceedings Volume 10621, 2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems; 1062119 (2018) https://doi.org/10.1117/12.2292973
Event: International Conference on Optical Instruments and Technology 2017, 2017, Beijing, China

Abstract

Digital in-line holographic microscopy is one of the most efficient methods for particle tracking as it can precisely measure the axial position of particles. However, imaging systems are often limited by detector noise, image distortions and human operator misjudgment making the particles hard to locate. A general method is used to solve this problem. The normalized holograms of particles were reconstructed to the pupil plane and then fit to a linear superposition of the Zernike polynomial functions to suppress the aberrations. Relative experiments were implemented to validate the method and the results show that nanometer scale resolution was achieved even when the holograms were poorly recorded.

Citation Download Citation

Xinyu Chang, Yuan Yang, Li Kou, Lei Jin, Junsheng Lu, and Xiaodong Hu "High resolution particle tracking method by suppressing the wavefront aberrations", Proc. SPIE 10621, 2017 International Conference on Optical Instruments and Technology: Optoelectronic Measurement Technology and Systems, 1062119 (12 January 2018); https://doi.org/10.1117/12.2292973

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