Paper
5 November 2018 Systematic parameter calibration in the wavefront testing with reverse Hartmann test
Yamei Yin, Daodang Wang, Zhongmin Xie, Ming Kong, Jun Zhao, Lihua Lei, Yanhua Zeng, Wentao Zhang
Author Affiliations +
Abstract
The deflectometry based on reverse-Hartmann-test configuration provides a feasible way for wavefront testing. Objects with complex surfaces place a high requirement on the wavefront testing accuracy, in which the systematic parameter is the key issue. In this paper, the effect of systematic parameters of the testing system such as the geometrical error and the approximation of systematic geometrical parameters are discussed in detail and a calibration method is proposed. Numerical simulation is carried out to demonstrate the feasibility of the proposed calibration method, for the transmitted wavefront with RMS 3.1220 μm, the testing optimization result of residual error with RMS value better than 20 nm is achieved.
© (2018) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Yamei Yin, Daodang Wang, Zhongmin Xie, Ming Kong, Jun Zhao, Lihua Lei, Yanhua Zeng, and Wentao Zhang "Systematic parameter calibration in the wavefront testing with reverse Hartmann test", Proc. SPIE 10815, Optical Design and Testing VIII, 108150Q (5 November 2018); https://doi.org/10.1117/12.2501143
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KEYWORDS
Wavefronts

Calibration

Wavefront aberrations

Error analysis

CCD cameras

Computing systems

Imaging systems

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