Paper
9 November 2018 THz modulation of monolayer WSe2-silicon hybrid structure and its performance after oxidation
Zhaoji Fang, Chenyi Xia, Zheng Li, Bo Wang, Yuan Huang, Li Wang, Xiaojun Wu
Author Affiliations +
Abstract
In recent years, THz modulators have been improved by 2D materials, yet facing a conflict between the demand for high modulation depth and the limitation of low pump power. Previously, by pumping continuous-wave laser on a highresistivity silicon wafer, we achieved modulation depth >95% in 0.3-1.5 THz, demanding continuous-wave pump power of 11.8 W. In this work, we added a mono-layer WSe2 on the high-resistivity silicon wafer by mechanical exfoliation, raising the modulation depth of THz pulse from 20% to 58% under 0.05 W femtosecond laser pump. The modulation depth can be further enhanced by raising pump power. The modulation behavior is most significant from 1.3 THz to >1.5 THz. This modulation enhancement is due to the interface state between WSe2 and silicon, as well as the direct bandgap of mono-layer WSe2. If exposed to the air, WSe2 starts oxidization at a low exciting power of <1 mW. Experiments shows that even if WSe2 is partly oxidized to WO3, the modulation depth is only slightly weakened, yet still better than the bare silicon substrate. Also, even if WSe2 does not fully cover the range of THz wave, or if the pump laser beam does not fully cover the range of THz wave, the modulation enhancement is also partly effective. Our work suggests a lowcost way to improve the efficiency of all-optical THz modulators.
© (2018) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Zhaoji Fang, Chenyi Xia, Zheng Li, Bo Wang, Yuan Huang, Li Wang, and Xiaojun Wu "THz modulation of monolayer WSe2-silicon hybrid structure and its performance after oxidation", Proc. SPIE 10826, Infrared, Millimeter-Wave, and Terahertz Technologies V, 108261L (9 November 2018); https://doi.org/10.1117/12.2502255
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Cited by 1 scholarly publication.
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KEYWORDS
Terahertz radiation

Modulation

Silicon

Femtosecond phenomena

Modulators

Oxidation

Raman spectroscopy

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