Commercial application of material-specific baggage screening using x-ray diffraction techniques (Conference Presentation)

Jens-Peter Schlomka; Holger Fleckenstein; Dirk Kosciesza; Joerg Meyer

doi:10.1117/12.2522522

14 May 2019 Commercial application of material-specific baggage screening using x-ray diffraction techniques (Conference Presentation)

Jens-Peter Schlomka, Holger Fleckenstein, Dirk Kosciesza, Joerg Meyer

Author Affiliations +

Proceedings Volume 10999, Anomaly Detection and Imaging with X-Rays (ADIX) IV; 1099907 (2019) https://doi.org/10.1117/12.2522522
Event: SPIE Defense + Commercial Sensing, 2019, Baltimore, MD, United States

Abstract

Established non-destructive, but penetrating techniques for baggage inspection are primarily based on the transmitted X-ray signal (AT systems, Computed Tomography), which allows determining the objects’ density and average atomic composition. X-ray diffraction is one of the few options to combine the penetrating properties of X-rays with the opportunity to gather material-specific information about the investigated object. While X-ray diffraction for scientific applications is widely used to determine spatial information on molecular level, the application in real-time at high throughput –as required for baggage inspection- has been emerging technology for a few decades now. This presentation will give an overview of the current established and evolving technologies and the required key performance parameters for the application in baggage screening. One realization of a fully 3D baggage screening concept named “X-ray Diffraction Imaging” (XDi) will be described in more detail.

Conference Presentation

Citation Download Citation

Jens-Peter Schlomka, Holger Fleckenstein, Dirk Kosciesza, and Joerg Meyer "Commercial application of material-specific baggage screening using x-ray diffraction techniques (Conference Presentation)", Proc. SPIE 10999, Anomaly Detection and Imaging with X-Rays (ADIX) IV, 1099907 (14 May 2019); https://doi.org/10.1117/12.2522522

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