Abstract
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ISBN: 9781510627307

ISBN: 9781510627314 (electronic)

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Authors

Numbers in the index correspond to the last two digits of the seven-digit citation identifier (CID) article numbering system used in Proceedings of SPIE. The first five digits reflect the volume number. Base 36 numbering is employed for the last two digits and indicates the order of articles within the volume. Numbers start with 00, 01, 02, 03, 04, 05, 06, 07, 08, 09, 0A, 0B…0Z, followed by 10-1Z, 20-2Z, etc.

AbdElazem, Sohaib, 0X

Ahmed, Nadeem, 0B, 0V

Al-Basheer, Watheq, 0X

Alnaimi, Radhwan, 0K

Arikkatt, A. J., 0H

Arnold, Thomas, 0D

Bartnik, Andrzej, 0H, 0I, 0L, 0M, 0N

Batshev, Vladislav I., 15

Bauer, Jens, 0D

Baumbach, T., 0U

Bogachev, Sergey A., 0F

Boritko, Sergey V., 15

Chen, J., 0P

Chen, Jinwen, 09, 0Q, 0R

Cui, Mingqi, 09, 0Q, 0R

Engelhardt, Sabine, 0U

Fang, Yu, 0O

Fiedorowicz, Henryk, 0H, 0I, 0L, 0M, 0N, 0W

Fok, Tomasz, 0I, 0L, 0M

Fomchenkov, Sergey A., 11

Frolov, Alexey D., 0Y

Frolov, Dmitry N., 0Y

Frost, Frank, 0D

Gaballah, Ahmed E. H., 0B, 0V

Guan, Zanyang, 0G

Halahovets, Yuriy, 0E

Hibino, Kenichi, 13

Hou, Xi, 0J

Hu, Xiaochuan, 0J

Janulewicz, K., 0L

Jarocki, Roman, 0M

Jergel, Matej, 0E

Ji, Bin, 09, 0Q, 0R

Jimenez, Kety, 0B, 0V

Kečkéš, Jozef, 0E

Kim, Yangjin, 13

Korytár, Dušan, 0E

Kostecki, J., 0N

Kotlyar, Victor V., 10, 11

Kozlova, Elena S., 10, 11

Krauze, W., 0N

Kunka, Danays, 08, 0U

Kuzin, Sergey V., 0F

Li, Miao, 09, 0Q, 0R

Li, Weiyan, 0O

Li, Yulong, 0G

Liu, Xiangming, 0G

Liu, Yangyang, 0O

Lv, Qunbo, 0O

Machikhin, Alexander S., 15

Maisano, M., 0N

Majková, Eva, 0E

Mat´ko, Igor, 0E

Mikhaylov, Andrey A., 08, 0U

Mikulík, Petr, 0E

Mitsuishi, Mamoru, 13

Nicolosi, Piergiorgio, 0B, 0V

Peng, Xiaoshi, 0G

Pertsov, Andrei A., 0F

Plech, Anton, 08

Pozhar, Vitold E., 15

Quan, Haiyang, 0J

Reich, Stefan, 08, 0U

Šiffalovič, Peter, 0E

Stafeev, Sergey S., 12

Torrisi, A., 0N, 0W

Torrisi, L., 0W

Toyoda, M., 0P

Tran Thi, Thu Nhi, 0E

Ulitschka, Melanie, 0D

Vinogradova, Olga A., 0Y

Vishnyakov, Eugene A., 0F

Vlnieska, Vitor, 08, 0U

Wachulak, Przemysław, 0H, 0I, 0L, 0M, 0N, 0W

Wang, Feng, 0G

Wang, Ming, 0G

Węgrzyński, Łukasz, 0H, 0I, 0L, 0M

Wei, Huiyue, 0G

Wen, Liyun, 0Y

Wu, Gaofeng, 0J

Xu, Tao, 0G

Yablokova, Anastasiya A., 15

Yamashita, S., 0P

Zaitsev, Vladislav D., 12

Zakharova, Margarita, 08, 0U

Zang, Zhigang, 0G

Zápražný, Zdenko, 0E

Zhang, Dandan, 0O

Zhang, Jiayi, 09, 0Q, 0R

Zhao, Na, 0O

Zhu, Jie, 09, 0Q, 0R

Zhu, Jingtao, 09, 0Q, 0R

Zhu, Shengming, 09, 0Q, 0R

Zuber, Marcus, 0U

Zuppella, Paola, 0B, 0V

Conference Committee

Symposium Chairs

  • Bedrich Rus, ELI Beamlines, Institute of Physics of the CAS, v.v.i. (Czech Republic)

  • Chris Edwards, STFC Rutherford Appleton Laboratory (United Kingdom)

  • Saša Bajt, Deutsches Elektronen-Synchrotron (Germany)

  • Ivo Rendina, Istituto per la Microelettronica e Microsistemi (Italy)

  • Mike Dunne, SLAC National Accelerator Laboratory (United States)

Honorary Symposium Chair

  • Erich Spitz, French Academy of Sciences, National Academy of Technologies (France) Advisor to Thales (France)

Conference Chairs

  • René Hudec, Astronomical Institute of the ASCR, v.v.i. (Czech Republic) and Czech Technical University in Prague (Czech Republic)

  • Ladislav Pina, Czech Technical University in Prague (Czech Republic)

Conference Program Committee

  • Webster Cash, University of Colorado at Boulder (United States)

  • Henryk Fiedorowicz, Military University of Technology (Poland)

  • René Hudec, Czech Technical University in Prague (Czech Republic)

  • Ali M. Khounsary, X-ray Optics, Inc. (United States)

  • Randall L. McEntaffer, The University of Iowa (United States)

  • Stephen L. O’Dell, NASA Marshall Space Flight Center (United States)

  • Giovanni Pareschi, INAF - Osservatorio Astronomico di Brera (Italy)

  • Ladislav Pina, Czech Technical University in Prague (Czech Republic)

  • Yuriy Ya Platonov, Rigaku Innovative Technologies, Inc.

  • (United States)

  • Paul B. Reid, Harvard-Smithsonian Center for Astrophysics (United States)

  • Bedrich Rus, ELI Beamlines (Czech Republic) and Institute of Physics of the ASCR, v.v.i. (Czech Republic)

  • Anatoly Snigirev, ESRF - The European Synchrotron (France)

  • Melville P. Ulmer, Northwestern University (United States)

  • David L. Windt, Reflective X-Ray Optics LLC (United States)

  • William W. Zhang, NASA Goddard Space Flight Center (United States)

Session Chairs

  • 1 Astronomical and Laboratory X-ray Optics

    Paola Zuppella, CNR-Istituto di Fotonica e Nanotecnologie (Italy)

  • 2 Refractive, Active, and Multilayer X-ray Optics

    Frank Siewert, Helmholtz-Zentrum Berlin für Materialien und Energie GmbH (Germany)

  • 3 Integrated Devices/Surface Characterization

    Henryk Fiedorowicz, Wojskowa Akademia Techniczna im. Jaroslawa Dabrowskiego (Poland)

  • 4 Coherent Radiation/Lasers

    Melanie Ulitschka, Leibniz-Institut für Oberflächenmodifizierung e.V. (Germany)

  • 5 Free-Space Optics

    Melanie Ulitschka, Leibniz-Institut für Oberflächenmodifizierung e.V. (Germany)

© (2019) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
"Front Matter: Volume 11032", Proc. SPIE 11032, EUV and X-ray Optics: Synergy between Laboratory and Space VI, 1103201 (4 June 2019); https://doi.org/10.1117/12.2535646
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KEYWORDS
X-ray optics

Extreme ultraviolet

Plasma

EUV optics

Laser applications

Laser interferometry

Laser metrology

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