Paper
3 June 2019 Low-coherence reflectometry in applications to media structure characterization
A. A. Isaeva, E. A. Isaeva, S. A. Yuvchenko, D. A. Zimnyakov
Author Affiliations +
Proceedings Volume 11066, Saratov Fall Meeting 2018: Laser Physics, Photonic Technologies, and Molecular Modeling; 110660Y (2019) https://doi.org/10.1117/12.2523215
Event: International Symposium on Optics and Biophotonics VI: Saratov Fall Meeting 2018, 2018, Saratov, Russian Federation
Abstract
Low-coherence reflectometry with the intensity moments analysis in application to laser-pumped dye-doped random medium characterization is discussed in this paper. A fluorescence radiation induced by the laser pumping formed a stochastic interference pattern. The established relationship between the second and third-order moments of multiple scattered fluorescence intensity, the coherence function, and the probability density distribution of the path length differences obtained using the Monte Carlo modeling allows us to characterize the general tendencies relating suppression of the stochastic interference of the quasi-monochromatic light in random multiple scattering media.
© (2019) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
A. A. Isaeva, E. A. Isaeva, S. A. Yuvchenko, and D. A. Zimnyakov "Low-coherence reflectometry in applications to media structure characterization", Proc. SPIE 11066, Saratov Fall Meeting 2018: Laser Physics, Photonic Technologies, and Molecular Modeling, 110660Y (3 June 2019); https://doi.org/10.1117/12.2523215
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Luminescence

Statistical analysis

Reflectometry

Stochastic processes

Confocal microscopy

Laser scattering

Modulation

Back to Top