Test System For MCT Photoconductor Arrays

N. Butler; A. Carson; A. J. Verrilli

doi:10.1117/12.960691

25 September 1989 Test System For MCT Photoconductor Arrays

N. Butler, A. Carson, A. J. Verrilli

Proceedings Volume 1108, Test and Evaluation of Infrared Detectors and Arrays; (1989) https://doi.org/10.1117/12.960691
Event: SPIE 1989 Technical Symposium on Aerospace Sensing, 1989, Orlando, FL, United States

Abstract

The architecture of a versatile, reliable, and expandable automatic test system is described. The system incorporates a low noise computer-like control and address bus into which a number of boards can be inserted. Individual boards have been designed to date to multiplex 16 detector inputs and bias one of them, to bias and multiplex 8 detectors, and to power internal dewar bias networks with a programmable low noise power supply. Test systems built with this architecture have been configured to test arrays of up to 180 elements at measurement frequencies from DC to 5 MHz. Noise levels well under 1 nV per root Hertz, with negligible stray signal contamination, are routinely obtained over the entire frequency range. Design details of individual modules will be described in addition to description of the overall system design and EMI control philosophy.

Citation Download Citation

N. Butler, A. Carson, and A. J. Verrilli "Test System For MCT Photoconductor Arrays", Proc. SPIE 1108, Test and Evaluation of Infrared Detectors and Arrays, (25 September 1989); https://doi.org/10.1117/12.960691

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