Fourier-transform profilometry using a pulse-encoded fringe pattern

Wei-Hung Su; Zhi-Hsiang Liu

doi:10.1117/12.2530715

9 September 2019 Fourier-transform profilometry using a pulse-encoded fringe pattern

Wei-Hung Su, Zhi-Hsiang Liu

Proceedings Volume 11123, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications XIII; 111230V (2019) https://doi.org/10.1117/12.2530715
Event: SPIE Optical Engineering + Applications, 2019, San Diego, California, United States

Abstract

A one-shot technique for profile measurements is presented. A sinusoidal fringe pattern embedded with one-dimensional pulses is used to illuminate the inspected object. The pattern projected on the inspected object is observed by a CCD camera at another view angle. The pulse-encoded fringe pattern provides additional information to identify the fringe order. Even though the surface color or reflectivity varies periodically with positions, it distinguishes the fringe order very well.

Citation Download Citation

Wei-Hung Su and Zhi-Hsiang Liu "Fourier-transform profilometry using a pulse-encoded fringe pattern", Proc. SPIE 11123, Photonic Fiber and Crystal Devices: Advances in Materials and Innovations in Device Applications XIII, 111230V (9 September 2019); https://doi.org/10.1117/12.2530715

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available