Paper
6 September 2019 Precision frequency measurement on a chip using weak value amplification
John Steinmetz, Kevin Lyons, Meiting Song, Jaime Cardenas, Andrew N. Jordan
Author Affiliations +
Abstract
We present an inverse weak value amplification (IWVA) scheme to perform precision frequency measurements in an integrated optics environment. The IWVA technique allows us to amplify small signals by introducing a weak perturbation to the system and performing a post-selection on the data. A Bragg grating with two band gaps is used to convert the optical frequency into a phase, and a perturbation is applied to the mode coefficients. We demonstrate the advantages of a Bragg grating with two band gaps for obtaining high transmission and low group velocity. We numerically model the interferometer, and demonstrate that we obtain the desired amplification effect. By using an on-chip device instead of a free space implementation, precision measurements can be carried out in a small volume with reliable performance.
© (2019) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
John Steinmetz, Kevin Lyons, Meiting Song, Jaime Cardenas, and Andrew N. Jordan "Precision frequency measurement on a chip using weak value amplification", Proc. SPIE 11134, Quantum Communications and Quantum Imaging XVII, 111340S (6 September 2019); https://doi.org/10.1117/12.2529564
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Cited by 2 scholarly publications.
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KEYWORDS
Waveguides

Bragg gratings

Interferometers

Integrated optics

Refraction

Dispersion

Precision measurement

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