Open Access Paper
12 July 2019 Silicon pore optics mirror module production and testing
Maximilien J. Collon, Giuseppe Vacanti, Nicolas M. Barrière, Boris Landgraf, Ramses Günther, Mark Vervest, Luc Voruz, Sjoerd Verhoex, Ljubiša Babić, Roy van der Hoeven, Kim van Straeten, Abdel Chatbi, David Girou, Marco W. Beijersbergen, Marcos Bavdaz, Eric Wille, Sebastiaan Fransen, Brian Shortt, Ivo Ferreira, Jeroen Haneveld, Arenda Koelewijn, Karin Booysen, Maurice Wijnperle, Jan-Joost Lankwarden, Coen van Baren, Alexander Eigenraam, Jan Willem den Herder, Peter Müller, Michael Krumrey, Vadim Burwitz, Giovanni Pareschi, Sonny Massahi, Desiree Della Monica Ferreira, Finn E. Christensen, Giuseppe Valsecchi, Paul Oliver, Ian Chequer, Kevin Ball, Karl-Heinz Zuknik, Dervis Vernani
Author Affiliations +
Proceedings Volume 11180, International Conference on Space Optics — ICSO 2018; 1118023 (2019) https://doi.org/10.1117/12.2535994
Event: International Conference on Space Optics - ICSO 2018, 2018, Chania, Greece
Abstract
Silicon Pore Optics (SPO) has been established as a new type of x-ray optics that enables future x-ray observatories such as Athena. SPO is being developed at cosine with the European Space Agency (ESA) and academic and industrial partners. The optics modules are lightweight, yet stiff, high-resolution x-ray optics, that shall allow missions to reach an unprecedentedly large effective area of several square meters, operating in the 0.2 to 12 keV band with an angular resolution better than 5 arc seconds. In this paper we are going to discuss the latest generation production facilities and we are going to present results of the production of mirror modules for a focal length of 12 m, including x-ray test results.
© (2019) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Maximilien J. Collon, Giuseppe Vacanti, Nicolas M. Barrière, Boris Landgraf, Ramses Günther, Mark Vervest, Luc Voruz, Sjoerd Verhoex, Ljubiša Babić, Roy van der Hoeven, Kim van Straeten, Abdel Chatbi, David Girou, Marco W. Beijersbergen, Marcos Bavdaz, Eric Wille, Sebastiaan Fransen, Brian Shortt, Ivo Ferreira, Jeroen Haneveld, Arenda Koelewijn, Karin Booysen, Maurice Wijnperle, Jan-Joost Lankwarden, Coen van Baren, Alexander Eigenraam, Jan Willem den Herder, Peter Müller, Michael Krumrey, Vadim Burwitz, Giovanni Pareschi, Sonny Massahi, Desiree Della Monica Ferreira, Finn E. Christensen, Giuseppe Valsecchi, Paul Oliver, Ian Chequer, Kevin Ball, Karl-Heinz Zuknik, and Dervis Vernani "Silicon pore optics mirror module production and testing", Proc. SPIE 11180, International Conference on Space Optics — ICSO 2018, 1118023 (12 July 2019); https://doi.org/10.1117/12.2535994
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CITATIONS
Cited by 2 scholarly publications.
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KEYWORDS
Mirrors

Silicon

X-rays

Coating

Reflectivity

Semiconducting wafers

X-ray optics

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