A Source For Soft X-Ray Imaging Microscopy With Nanosecond Exposure Time

R. Holz; J. Eberle; R. Lebert; W. Neff; F. Richter

doi:10.1117/12.961813

27 November 1989 A Source For Soft X-Ray Imaging Microscopy With Nanosecond Exposure Time

R. Holz, J. Eberle, R. Lebert, W. Neff, F. Richter

Proceedings Volume 1140, X-Ray Instrumentation in Medicine and Biology, Plasma Physics, Astrophysics, and Synchrotron Radiation; (1989) https://doi.org/10.1117/12.961813
Event: 1989 International Congress on Optical Science and Engineering, 1989, Paris, France

Abstract

The radiation characteristics of a plasma focus operated with nitrogen is investigated. To optimize this source at a particular wavelength with respect to its application in X-ray microscopy, several diagnostic methods are applied to measure the emitted radiation with temporal, spectral and spatial resolution. A well suited diagnostic technique is the imaging of the source by means of a condenser zone plate.

Citation Download Citation

R. Holz, J. Eberle, R. Lebert, W. Neff, and F. Richter "A Source For Soft X-Ray Imaging Microscopy With Nanosecond Exposure Time", Proc. SPIE 1140, X-Ray Instrumentation in Medicine and Biology, Plasma Physics, Astrophysics, and Synchrotron Radiation, (27 November 1989); https://doi.org/10.1117/12.961813

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