Single pulse photon diagnostic of beam properties for high-repetition-rates XFEL

Ran An; Yan Ye; Qianli Li; Hui He; Liangliang Du; Limin Meng

doi:10.1117/12.2553032

31 January 2020 Single pulse photon diagnostic of beam properties for high-repetition-rates XFEL

Ran An, Yan Ye, Qianli Li, Hui He, Liangliang Du, Limin Meng

Proceedings Volume 11427, Second Target Recognition and Artificial Intelligence Summit Forum; 114273I (2020) https://doi.org/10.1117/12.2553032
Event: Second Target Recognition and Artificial Intelligence Summit Forum, 2019, Changchun, China

Abstract

Photon diagnostic for high-repetition-rates XFEL are treated to be a huge challenge for all the XFEL project, especially the single pulse imager diagnostic. A device has been designed by our team for single pulse photon diagnostics of future CAEP-XFEL project with 2.3ns gap of each pulse in pulse trains. The most popular way to obtain the imager of photon beam is directly seeing it from a scintillators such as YAG:Ce with a common CCD/CMOS camera. However, the gap of pulse to pulse can be around 220ns at a typical high-repetition-rates XFEL facility such as EU-XFEL while the gap may as small as 2.3ns for CAEP-XFEL. In this circumstances, this kind of devices may not be suitable any more. Ultrafast scintillator with the decay time less than 2.3ns and framing camera with sub-nanosecond exposure time may be a feasible way to achieve it. Some research have been done to find the suitable ultrafast scintillator.

Citation Download Citation

Ran An, Yan Ye, Qianli Li, Hui He, Liangliang Du, and Limin Meng "Single pulse photon diagnostic of beam properties for high-repetition-rates XFEL", Proc. SPIE 11427, Second Target Recognition and Artificial Intelligence Summit Forum, 114273I (31 January 2020); https://doi.org/10.1117/12.2553032

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