Poster + Paper
15 December 2020 Upgrade of the x-ray parallel beam facility XPBF 2.0 for characterization of silicon pore optics
Author Affiliations +
Conference Poster
Abstract
The X-ray parallel beam facility XPBF 2.0 in the laboratory of the Physikalisch-Technische Bundesanstalt at the synchrotron radiation facility BESSY II provides a parallel beam of very low divergence, and adjustable beam sizes between about 100 μm and at least 5 mm. Further, XPBF 2.0 is equipped with a vacuum chamber with a hexapod system for accurate positioning of all silicon pore optic (SPO) sizes to be investigated, and a vertically movable CCD-based camera system to register the direct and the reflected beam at a sample to CCD distance of 12 m corresponding to the envisaged focal length of ATHENA (Advanced Telescope for High ENergy Astrophysics). Since its installation in 2016, the beamline has been constantly upgraded to improve performance and implementing the changing requirements. To accurately and constantly measure the 12 m distance, between the center of the sample (i.e. mirror module) and the CCD detector, a laser-tracker has been installed. Additionally, the cleanroom, housing the vacuum chamber, was upgraded with a cooling unit keeping the temperature at 20°C. The original phosphor screen in front of the CCD has been replaced with a new phosphor screen with different grain size and material. The next upgrade of the XPBF 2.0 is the installation of a new monochromator mirror to operate the beamline at 1.0 keV instead of 1.6 keV. This paper will present the upgrades of the X-ray parallel beam facility XPBF 2.0 and discuss next steps for characterizing SPOs with synchrotron radiation.
© (2020) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Evelyn Handick, Levent Cibik, Michael Krumrey, Peter Müller, Nicolas Barrière, Maximilien Collon, Enrico Hauser, Giuseppe Vacanti, Sjoerd Verhoeckx, Marcos Bavdaz, and Eric Wille "Upgrade of the x-ray parallel beam facility XPBF 2.0 for characterization of silicon pore optics", Proc. SPIE 11444, Space Telescopes and Instrumentation 2020: Ultraviolet to Gamma Ray, 114444G (15 December 2020); https://doi.org/10.1117/12.2561236
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KEYWORDS
X-rays

Silicon

X-ray optics

X-ray characterization

CCD cameras

Charge-coupled devices

Imaging systems

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