Paper
1 December 1989 Micro-FTIR As A Stress Probe For Ceramic Materials
James W. Rydzak, W. Roger Cannon, Maarit Hanninen
Author Affiliations +
Proceedings Volume 1145, 7th Intl Conf on Fourier Transform Spectroscopy; (1989) https://doi.org/10.1117/12.969430
Event: Seventh International Conference on Fourier and Computerized Infrared Spectroscopy, 1989, Fairfax, VA, United States
Abstract
A method to measure stress in ceramics has been developed using an FTIR equipped with an infrared microscope. The method, developed with sapphire a a model ceramic materfal, involves calibration of small shifts in the 630 cm -1 band. A differential technique using spectral subtraction was developed to accurately measure the shifts (0.1-0.4 cm'). A four point bending apparatus was built to induce variable stresses in the surface of the sapphire. Ttle amount of stress has been correlated with the measured shift in the 630 cm 11absorbance band. The technique has been automated using a computer controlled mapping stage. Stresses near a crack in a sapphire sample have been profiled. This non-destructive technique has applications as a tool to help understand and improve mechanical properties of polycrystalline ceramics, composites, and optical fibers.
© (1989) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
James W. Rydzak, W. Roger Cannon, and Maarit Hanninen "Micro-FTIR As A Stress Probe For Ceramic Materials", Proc. SPIE 1145, 7th Intl Conf on Fourier Transform Spectroscopy, (1 December 1989); https://doi.org/10.1117/12.969430
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KEYWORDS
Sapphire

Calibration

Ceramics

Infrared radiation

Polarizers

Microscopes

Raman spectroscopy

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