Investigation on organic thin film transistors (TFT) by Kelvin probe force microscopy (KPFM)

Mélanie Brouillard; Ute Zschieschang; Nicolas Bogdan Bercu; Olivier Simonetti; Hagen Klauk; Louis Giraudet

doi:10.1117/12.2567406

22 August 2020 Investigation on organic thin film transistors (TFT) by Kelvin probe force microscopy (KPFM)

Mélanie Brouillard, Ute Zschieschang, Nicolas Bogdan Bercu, Olivier Simonetti, Hagen Klauk, Louis Giraudet

Proceedings Volume 11476, Organic and Hybrid Field-Effect Transistors XIX; 1147614 (2020) https://doi.org/10.1117/12.2567406
Event: SPIE Organic Photonics + Electronics, 2020, Online Only

Conference Poster

Abstract

Using Kelvin Probe Force Microscopy (KPFM), we performed surface-potential measurements on operating organic thin-film transistors (TFTs). Several parameters inaccessible through current-voltage measurements were determined, namely the source and drain resistances separately, the threshold voltage and the electric field along the channel. We show that the source resistance is always higher than the drain resistance, and non-linear intrinsic behavior is demonstrated in some cases. The threshold voltage extracted by KPFM is different from that extracted from current-voltage measurements. By analyzing the tip response using calibration samples, the electric field at the source/channel interface can be estimated within a small error margin.

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Citation Download Citation

Mélanie Brouillard, Ute Zschieschang, Nicolas Bogdan Bercu, Olivier Simonetti, Hagen Klauk, and Louis Giraudet "Investigation on organic thin film transistors (TFT) by Kelvin probe force microscopy (KPFM)", Proc. SPIE 11476, Organic and Hybrid Field-Effect Transistors XIX, 1147614 (22 August 2020); https://doi.org/10.1117/12.2567406

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