Optimizing raster scanning parameters in nondestructive evaluation using simulation of probe sensitivity field

Ajay M. Koshti

doi:10.1117/12.2581691

22 March 2021 Optimizing raster scanning parameters in nondestructive evaluation using simulation of probe sensitivity field

Ajay M. Koshti

Author Affiliations +

Proceedings Volume 11592, Nondestructive Characterization and Monitoring of Advanced Materials, Aerospace, Civil Infrastructure, and Transportation XV; 115920Q (2021) https://doi.org/10.1117/12.2581691
Event: SPIE Smart Structures + Nondestructive Evaluation, 2021, Online Only

Abstract

The paper provides a model for multi-hit limited sample POD analysis for simulated raster scanning that is used for flaw detection in nondestructive evaluation. Raster scanning is used in ultrasonic testing with unfocused and focused transducers. In multi-hit POD analysis, system resolution is taken into account. The scan data, known as C-scan, is represented as a 2D pixel grid. Typically, the pixel gray value is equal to the ultrasonic signal amplitude. The data is taken at every step or index between the pixels. Each pixel represents an area of part that is sampled by the transducer. The sampled area or the aperture provides the signal amplitude. The step size may be equal to or smaller than the aperture, creating either a non-overlapping or overlapping aperture scan pattern. Optimal scanning uses least number of steps or pixels that can provide reliable flaw detection, accurate flaw sizing and adequate spatial resolution for the target size and larger flaws. Here, the scan patterns are defined in relation to the target flaw size, transducer aperture, and step size. In this work, probe field is simulated as symmetrical bivariate standard distribution and distribution and flaw as a square shaped reflector. This arrangement is similar to a raster scan with focused transducer. The optimal scan pattern is determined by simulating a number of scan patterns and comparing their signal amplitude, flaw sizing accuracy, probability of detection and probability of false positive in relation to contrast-to-noise ratio. If results of such simulation are corroborated in empirical data, the model can be used in assessing reliability of flaw detection in NDE as well as for choosing optimal scan pattern.

Conference Presentation

Citation Download Citation

Ajay M. Koshti "Optimizing raster scanning parameters in nondestructive evaluation using simulation of probe sensitivity field", Proc. SPIE 11592, Nondestructive Characterization and Monitoring of Advanced Materials, Aerospace, Civil Infrastructure, and Transportation XV, 115920Q (22 March 2021); https://doi.org/10.1117/12.2581691

ACCESS THE FULL ARTICLE

INSTITUTIONAL
Select your institution to access the SPIE Digital Library.

SELECT YOUR INSTITUTION

PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.

PERSONAL SIGN IN

No SPIE Account? Create one

PURCHASE THIS CONTENT

SUBSCRIBE TO DIGITAL LIBRARY

50 downloads per 1-year subscription

Members: $195

Non-members: $335 ADD TO CART

25 downloads per 1 - year subscription

Members: $145

Non-members: $250 ADD TO CART

PURCHASE SINGLE ARTICLE

Includes PDF, HTML & Video, when available