In Situ Application Of Electronic Speckle Pattern Interferometry (ESPI) In The Investigation Of Stone Decay

G. Gulker; K. Hinsch; C. Holscher; A. Kramer; H. Neunaber

doi:10.1117/12.962743

25 April 1990 In Situ Application Of Electronic Speckle Pattern Interferometry (ESPI) In The Investigation Of Stone Decay

G. Gulker, K. Hinsch, C. Holscher, A. Kramer, H. Neunaber

Author Affiliations +

Proceedings Volume 1162, Laser Interferometry: Quantitative Analysis of Interferograms: Third in a Series; (1990) https://doi.org/10.1117/12.962743
Event: 33rd Annual Technical Symposium, 1989, San Diego, United States

Abstract

A miniaturized electronic speckle pattern interferometry system (ESPI) has been developed for in situ measurements of microdeformations on buildings and monuments. Direct coupling between object and the compact optical head of the system enabled detection of microdisplacements even in non laboratory environments. Several examples of applications in deterioration investigations are presented.

Citation Download Citation

G. Gulker, K. Hinsch, C. Holscher, A. Kramer, and H. Neunaber "In Situ Application Of Electronic Speckle Pattern Interferometry (ESPI) In The Investigation Of Stone Decay", Proc. SPIE 1162, Laser Interferometry: Quantitative Analysis of Interferograms: Third in a Series, (25 April 1990); https://doi.org/10.1117/12.962743

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