Paper
25 January 1990 Remote Attitude Measurement Via Doppler Interferometer
David J. Wilson, Charles E. Craven, Donald R. Snyder, Mark F. Hopkins, Russell A. Chipman, Randall R. Hodgson
Author Affiliations +
Abstract
Pitch and yaw of objects moving at high velocities can be measured with a Doppler interferometer system employing corner cube retroreflectors mounted on the moving object. Measurement of pitch or yaw alone was demonstrated in laboratory and field experiments. Using the Jones calculus, the polarization considerations for measuring both pitch and yaw simultaneously have been analyzed.
© (1990) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
David J. Wilson, Charles E. Craven, Donald R. Snyder, Mark F. Hopkins, Russell A. Chipman, and Randall R. Hodgson "Remote Attitude Measurement Via Doppler Interferometer", Proc. SPIE 1166, Polarization Considerations for Optical Systems II, (25 January 1990); https://doi.org/10.1117/12.962922
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KEYWORDS
Polarization

Doppler effect

Sensors

Interferometers

Retroreflectors

Wave plates

Jones vectors

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