Presentation + Paper
20 June 2021 Artifacts-free Fourier ptychographic microscopy using a misaligned setup
V. Bianco, B. Mandracchia, J. Bĕhal, D. Barone, P. Memmolo, P. Ferraro
Author Affiliations +
Abstract
Fourier Ptychographic Microscopy (FPM) probes biological samples from multiple directions and provides amplitude and quantitative phase-contrast imaging in label-free modality with large space-bandwidth product. FPM is suitable to analyze tissues in hospitals and analysis labs by unskilled users. Whenever the FPM setup is misaligned, phase artifacts can prevent a correct retrieval of the sample complex amplitude. Here we show a blind method, named Multi-Look FPM, which eliminates the unwanted artifacts and allows non-expert users skipping the recalibration process. Multi-Look FPM is proved effective in the case of neural tissue slides, cell layers, and marine microalgae with complex inner structures.
Conference Presentation
© (2021) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
V. Bianco, B. Mandracchia, J. Bĕhal, D. Barone, P. Memmolo, and P. Ferraro "Artifacts-free Fourier ptychographic microscopy using a misaligned setup", Proc. SPIE 11786, Optical Methods for Inspection, Characterization, and Imaging of Biomaterials V, 1178613 (20 June 2021); https://doi.org/10.1117/12.2592550
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KEYWORDS
Microscopy

Light emitting diodes

Microscopes

Tissues

Optical engineering

Photonic microstructures

Quantum electronics

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