CONFERENCE PROCEEDINGS
Advanced Search
Home > Proceedings > Volume 11811 > Article
Presentation + Paper
1 August 2021 A new approach to transfer characteristic slope estimation
Vishash Verma, Drona Dahal, Raj Kishen Radha Krishnan, Björn Lüssem, Tsung-Heng Tsai
Author Affiliations +
Proceedings Volume 11811, Organic and Hybrid Field-Effect Transistors XX; 118110B (2021) https://doi.org/10.1117/12.2593301
Event: SPIE Organic Photonics + Electronics, 2021, San Diego, California, United States
Abstract
Organic field-effect transistors (OFETs) have found a wide range of uses due to their attractive properties. A great deal of effort has been expended on boosting their mobilities, which tend to be low. Given this, accurate estimation of the mobility is crucial. We have developed a web application that automates or simplifies several of the steps required to estimate the mobility from experimental data. The app can be accessed at ofetanalysisapp.shinyapps.io/ofetanalysisapp. The app takes as inputs a file with the data and pieces of information like the number of OFETs and their channel lengths. The app has features that enable the user to mark OFETs as outliers, which are excluded from subsequent calculations. It fits nonlinear regression models to compute estimates of the mobility as well as the threshold voltage. The app provides several visualizations that give the user insight into the nature of the data. The estimates computed by the app can be downloaded in an Excel file so the user can perform further analysis. The use of the app is illustrated with a dataset from one of our OFET experiments.
Conference Presentation
© (2021) COPYRIGHT Society of Photo-Optical Instrumentation Engineers (SPIE). Downloading of the abstract is permitted for personal use only.
Citation Download Citation
Vishash Verma, Drona Dahal, Raj Kishen Radha Krishnan, Björn Lüssem, and Tsung-Heng Tsai "A new approach to transfer characteristic slope estimation", Proc. SPIE 11811, Organic and Hybrid Field-Effect Transistors XX, 118110B (1 August 2021); https://doi.org/10.1117/12.2593301
ACCESS THE FULL ARTICLE
ORGANIZATIONAL
Sign in with credentials provided by your organization.
INSTITUTIONAL
Select your institution to access the SPIE Digital Library.
SELECT YOUR INSTITUTION
PERSONAL
Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.
PERSONAL SIGN IN
No SPIE Account? Create one
PURCHASE THIS CONTENT
SUBSCRIBE TO DIGITAL LIBRARY
50 downloads per 1-year subscription
Members: $195
Non-members: $335 ADD TO CART
25 downloads per 1 - year subscription
Members: $145
Non-members: $250 ADD TO CART
PURCHASE SINGLE ARTICLE
Includes PDF, HTML & Video, when available
Members: $17.00
Non-members: $21.00 ADD TO CART
PROCEEDINGS
 11 PAGES + PRESENTATION
DOWNLOAD PAPER SAVE TO MY LIBRARY
WATCH
PRESENTATION
GET CITATION
Advertisement
Advertisement
RIGHTS & PERMISSIONS
Get copyright permission  Get copyright permission on Copyright Marketplace
KEYWORDS
Field effect transistors
Data processing
Transistors
Data analysis
Statistical analysis
Visualization
RELATED CONTENT
Subscribe to Digital Library
Receive Erratum Email Alert
Back to Top