PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.
The phase imaging has a higher sensitivity for low-Z materials than conventional absorption imaging. We have developed a high-resolution X-ray phase microscope in combination with a Lau interferometer and used it for phase tomography. However, an existing method cannot avoid artifacts originating from the assumption of a two-beam interference model. In this study, we take a three-wave interference model into account to reduce the artifacts and propose a new method to attain phase tomography. In the presentation, we will demonstrate the reduction of the artifacts with the results of phase tomography.
PERSONAL Sign in with your SPIE account to access your personal subscriptions or to use specific features such as save to my library, sign up for alerts, save searches, etc.